Spectrometer with validation cell

ABSTRACT

A valid state of an analytical system that includes a light source and a detector can be verified by determining that deviation of first light intensity data quantifying a first intensity of light received at the detector from the light source after the light has passed at least once through each of a reference gas in a validation cell and a zero gas from a stored data set does not exceed a pre-defined threshold deviation. The stored data set can represent at least one previous measurement collected during a previous instrument validation process performed on the analytical system. The reference gas can include a known amount of an analyte. A concentration of the analyte in a sample gas can be determined by correcting second light intensity data quantifying a second intensity of the light received at the detector after the light passes at least once through each of the reference gas in the validation cell and a sample gas containing an unknown concentration of the analyte compound. Related systems, methods, and articles of manufacture are also described.

CROSS-REFERENCE TO RELATED APPLICATIONS

The current application claims priority under 35 U.S.C. §119(e) to U.S.Provisional Application Ser. No. 61/405,589, filed on Oct. 21, 2010.This application is related to co-pending and co-owned U.S. patentapplication Ser. No. 13/______, filed on Feb. 14, 2011 and entitled“Validation and Correction of Spectrometer Performance Using aValidation Cell.” The disclosures of the priority application andrelated application are each incorporated by reference herein in theirentireties.

TECHNICAL FIELD

The subject matter described herein relates to quantifying gas-phaseconcentrations of chemical analytes, for example using spectroscopicanalysis systems that include a validation cell that contains one ormore reference gases or a full or partial vacuum.

BACKGROUND

Trace gas analyzers can require periodic validation of long termfidelity of the concentration measurements they generate, for examplewith respect to the performance of an analyzer relative to factorycalibration or relative to a standard which is traceable to a nationalor international bureau of standards (e.g. including but not limited tothe National Institute of Standards and Technology). Currently availablesolutions for in-field measurement validation typically include the useof permeation tube devices or calibrations performed using referencesamples provided from a compressed gas cylinder.

Frequency stabilization of a tunable laser light source can be criticalfor quantitative trace gas absorption spectroscopy. Depending on theoperational wavelength, a tunable laser source such as a diode laser cantypically exhibit a wavelength drift on the order of a few picometers(on the order of gigahertz) per day to fractions of picometers per day.A typical trace gas absorption band linewidth can in some instances beon the order of a fraction of a nanometer to microns. Thus, drift of thelaser light source can, over time, introduce critical errors inidentification and quantification of trace gas analytes, particularly ingas having one or more background compounds whose absorption spectramight interfere with absorption features of a target analyte.

Permeation tube based validation systems are generally costly andcomplex and typically require very precise control of temperature andgas flow rates and elimination of temperature gradients across thepermeation tube to provide an accurate result. Aging and contaminationof permeation tube devices can alter the permeation rate over time,thereby causing a change in the validation measurement reading andpotentially rendering the validation inaccurate over time. This problemcan be addressed, albeit at potentially substantial expense, by frequentreplacement of the permeation tube device. Further challenges can arisein the replacement of permeation tube devices in the field, as it can bedifficult to correlate the trace gas concentration generated by areplacement permeation device to a bureau of standards traceableanalyzer calibration. Permeation-based validation systems can alsorequire a significant amount of carrier gas and analyte gas to preparethe validation gas stream. Permeation-based devices generally are notfeasible when very reactive or corrosive gases are involved.Furthermore, permeation-based devices generally cannot accuratelyprepare low concentration (e.g., less than 10 parts per million andparticularly on the order of parts per billion or smaller) validationstreams for trace analyte measurements. A validation stream shouldadvantageously remain accurate over a practical operating temperaturerange. Extreme temperature sensitivity of permeation devices can be akey challenge. For example, temperature changes of as little as 0.1° C.can cause moisture concentration changes of magnitude greater than ±10%of the nominal validation concentration, which is generally notacceptable for in field analyzer validation.

Validation using a reference gas of known concentration provided from acompressed gas cylinder can be used for gas chromatograph validationapplications. Such an approach can be substantially more costly with aspectroscopic measurement. A reference gas measurement can involve gasflow rates through a sample measurement cell at rates of, for example,approximately 0.1 to 3 liters per minute, which is multiple orders ofmagnitude greater than the typical flow rates of micro-liters per minuteused in gas chromatographs. Reference gas blends provided in compressedgas cylinders can be difficult or impossible to obtain, especially inremote areas of the world where many natural gas processing,petrochemical, chemical, and refining plants are located. Shipping ofpressurized gas cylinders can be costly and can take a very long timebecause pressurized gas cylinders generally cannot be shipped onairplanes. Additionally, reference gas cylinders can require heatingblankets or placement inside temperature controlled cabinets, housings,etc. to prevent diurnal temperature fluctuations from rapidly degradingthe certified reference composition in the cylinder. In addition carriergas and trace analytes have been found to not mix uniformly, e.g. attypical gas cylinder pressures of 50 psi (pounds per square inch) to3000 psi, without mechanical agitation or heating. As a result, even areference gas mixture that is gravimetrically certified upon originalpreparation (e.g. by use of suitable bureau of standards traceableweights and scales) can produce varying trace gas concentrations in thegas withdrawn from the cylinder over time, thereby creating erroneous,changing concentration readings of the analyzer during successivevalidation attempts.

Even with such precautions, however, a pressurized cylinder containing areactive trace gas will typically maintain a stable, reproduciblereference gas concentration for only a few months at most, due toreactions of the trace gas with the cylinder. Reactions with cylinderwalls can be a significant issue for many reactive trace gases,including but not necessarily limited to H₂S, HCl, NH₃, H₂O, and thelike. It can be especially difficult to prepare accurate moisture blendsthat remain stable for a period longer than 6 months. At present,certified and traceable reference gas blend in pressurized cylindersthat reliably provides a moisture content of less than about 10 ppm withan accuracy better than approximately ±10% are not available. Thus,instrument validations for analyzers capable of measuring moisturelevels of less than about 1 ppm, for example in liquefied natural gas,dry cracked gas, hydrogen, nitrogen, oxygen, air, ethylene, propylene,olefins propane and butanes, can be extremely difficult. As an example,this lack of a suitable moisture reference gas mix for concentrations<10 ppm currently presents a very significant operational challenge forproduction of liquid gas. Typically, natural gas liquefication trainsneed to reliably maintain moisture levels well below 1.5 ppm to mitigateicing of the liquefication equipment. Undetected moisture excursions tolevels above about 1 ppm generally lead to icing of the equipment. Asingle instance of needing to thaw the gas liquefication equipment torestore productive operations can readily result in an operating loss inexcess of $5,000,000.

Production of ethylene and propylene, the basic building blocks for thevast majority of plastics used in daily life, carries requirements tomaintain trace impurity levels well below 50 ppb to prevent productionof inferior quality poly-ethylene and poly-propylene. These impuritiescan include, but are not limited to, NH₃, H₂O, C₂H₂, CO₂ and CO. Ingeneral, bottled gas mixtures cannot provide accurate, bureau ofstandards traceable validation for such low concentration measurements.Permeation tube validation technology is not well suited to providingtrustworthy validation results for ethylene and propylene contaminationmeasurements either. In addition to the extreme requirements fortemperature stability and flow control, permeation tube devices aregenerally incapable of reliably providing trace gas concentrations below10 ppm. Typical optical and TDL trace gas analyzers that measure below50 ppb cannot support accurate measurement of trace gas levels greaterthan approximately 10 ppm at the same time.

SUMMARY

In one aspect, an apparatus includes a validation cell positioned suchthat light generated by a light source passes through the validationcell at least once in transmission of the light from the light source toa detector. The validation cell contains a reference gas comprising aknown amount of an analyte compound. The light source emits the light ina wavelength range that comprises a spectral absorbance feature of theanalyte compound. A controller performs an instrument validation processand a sample analysis process. The instrument validation processincludes receiving first light intensity data that quantify a firstintensity of the light received at the detector while the light passesat least once through each of the reference gas in the validation celland a zero gas, and verifying a valid state of the analytical system bydetermining that the first light intensity data do not deviate from astored data set that by greater than a pre-defined threshold deviation.The zero gas has at least one of known and negligible first lightabsorbance characteristics that overlap second light absorbancecharacteristics of the analyte compound within the wavelength range. Thestored data set represents at least one previous measurement collectedduring a previous instrument validation process performed on theanalytical system. The sample analysis process includes receiving secondlight intensity data that quantify a second intensity of the lightreceived at the detector while the light passes at least once througheach of the reference gas in the validation cell and a sample gascontaining an unknown concentration of the analyte compound, anddetermining a concentration of the analyte compound in the sample gas bycorrecting the second light intensity data to account for a knownabsorbance of the light in the validation cell.

In an interrelated aspect, a method includes receiving first lightintensity data that quantify a first intensity of light received at adetector from a light source after the light has passed at least oncethrough each of a reference gas in a validation cell and a zero gas. Thereference gas includes a known amount of an analyte compound. The lightsource emits the light in a wavelength range that comprises a spectralabsorbance feature of the analyte compound. The zero gas has at leastone of known and negligible first light absorbance characteristics inthe wavelength range. The method further includes verifying a validstate of an analytical system that includes the light source and thedetector by determining that the first light intensity data do notdeviate from a stored data set by greater than a pre-defined thresholddeviation. The stored data set represents at least one previousmeasurement collected during a previous instrument validation processperformed on the analytical system. The method also includes receivingsecond light intensity data that quantify a second intensity of thelight received at the detector from the light source after the lightpasses at least once through each of the reference gas in the validationcell and a sample gas containing an unknown concentration of the analytecompound. A concentration of the analyte compound in the sample gas isdetermined by correcting the second light intensity data to account fora known absorbance of the light in the validation cell.

In additional aspects, articles are also described that comprise atangibly embodied machine-readable medium operable to cause one or moremachines (e.g., computers, etc.) to result in operations describedherein. Similarly, computer systems are also described that may includea processor and a memory coupled to the processor. The memory mayinclude one or more programs that cause the processor to perform one ormore of the operations described herein.

In some variations one or more of the following additional features canoptionally be included in any feasible combination. A sample measurementcell can contain an analysis volume that contains the sample gas duringthe sample analysis process and the zero gas during the instrumentvalidation process. The sample measurement cell can be positioned suchthat the light passes at least once through each of the analysis volumein the sample measurement cell and the reference gas in the validationcell during transmission of the light from the light source to thedetector. The system can also include a flow switching apparatus thatthe controller (or other means) can activate to admit the sample gasinto the analysis volume of the sample measurement cell during thesample analysis process and to admit the zero gas into the analysisvolume of the sample measurement cell during the instrument validationprocess. The zero gas can include at least one of a noble gas, nitrogengas, oxygen gas, air, hydrogen gas, a homo-nuclear diatomic gas, atleast a partial vacuum, a hydrocarbon gas, a fluorocarbon gas, achlorocarbon gas, carbon monoxide gas, and carbon dioxide gas. The zerogas can be passed through at least one of a scrubber and a chemicalconverter to remove or reduce a concentration of the trace analytetherein before directing the zero gas into the path of the light.

The additional optional features can also include the validation cellhaving a light transmissive optical surface through which the lightpasses. The validation cell can include a light reflective opticalsurface upon which the light impinges and is at least partiallyreflected. The light reflective optical surface and/or the lighttransmissive optical surface can form at least part of the validationcell. The sample measurement cell can include a light reflective opticalsurface upon which the light impinges and is at least partiallyreflected. The sample measurement cell can include a light transmissiveoptical surface through which the light passes. The light reflectiveoptical surface and/or the transmissive optical surface can form atleast part of the sample measurement cell. An integrated optical cellcan include both of the validation cell and the sample measurement cell.The integrated optical cell can include a multipass cell comprising afirst reflective optical surface and a second optical reflectivesurface, each reflecting the light at least once. The validation cellcan be contained between at least part of the first reflective opticalsurface and a transmissive optical surface disposed between the firstreflective optical surface and the second optical reflective surface anda light transmissive surface disposed before the first reflectivesurface. The integrated optical cell can include a multipass cellincluding a first reflective optical surface and a second reflectiveoptical surface, each reflecting the light at least once, and whereinthe validation cell is contained before at least part of the firstreflective optical surface and a transmissive optical surface disposedbefore the first reflective surface.

The additional optional features can also include at least one of thevalidation cell and the sample measurement cell being contained within ahollow core optical light guide hermetically sealed on a first end by afirst light-transmissive optical element allowing the light to enter thehollow optical light guide and hermetically sealed on an opposite end bya second light transmissive optical element allowing the light to exitthe hollow core optical light guide. At least one of the validation celland the sample measurement cell can be integral to a hermetically sealedlaser package from which the light is transmitted via at least onetransmissive optical element that forms a seal to the hermeticallysealed laser package.

The additional optional features can also include at least one of atemperature sensor that determines a temperature in the validation celland a pressure sensor that determines a pressure in the validation cellcan be included to provide data including at least one of thetemperature and the pressure. The known absorbance of the light in thevalidation cell can be adjusted based on the one or more of thetemperature and the pressure as part of determining the concentration ofthe analyte in the sample gas. A temperature control system can maintaina temperature in the validation cell at a preset value. The validationcell can include one of a sealed container pre-loaded with the referencegas and a flow-through cell through which the reference gas is passed.

The additional optional features can also include the path of the lightpassing through a free gas space at least once in traversing between thelight source and the detector. A flow switching apparatus can admit thesample gas into the free gas space during the sample analysis mode andadmit the zero gas into the free gas space during the validation mode.The validation cell can be integral to a first reflector positioned on afirst side of the free gas space. The path of the light can reflect atleast once off of each of the first reflector and a second reflectorpositioned on a opposite side of the free gas space in traversingbetween the light source and the detector.

The subject matter described herein provides many advantages. Forexample, validation of an existing calibration of a gas analyzer can beperformed with lower cost, less complexity, and the need only to supplya zero gas (described in more detail below) in the sample measurementcell (or alternatively in a free gas space that contains a sample gasduring an analysis mode) to provide an absorbance-free background for avalidation measurement. Nitrogen, an example of a zero gas, can beespecially easy to obtain, for example in compressed cylinders, from anon-site air separation plant that manufactures nitrogen from air, or thelike. Use of a stable, easy to obtain zero gas can eliminate shelf lifeissues typically associated with compressed gas cylinders containingmixes of the trace gas itself and can also eliminate issues related togas mixing at high pressures and withdrawal of gas mixes from compressedcylinders.

Furthermore, the current subject matter can eliminate or at least reducethe need for costly and complex permeation tube devices and/or forreference gases in pressurized gas cylinders, which can be difficult toobtain and maintain. Repeated measurement validation checks can beperformed over long periods of time without significant aging effectsand without consuming a difficult to obtain and shelf life limitedreference gas mixture.

The current subject matter can also enable an absorption spectrometer tore-calibrate itself or example using an iterative process in which oneor more operating and/or analytical parameters of the laser absorptionspectrometer are adjusted to find new operating and/or analyticalconditions that cause the spectrometer to perform more closely to apreviously recorded calibration condition.

The details of one or more variations of the subject matter describedherein are set forth in the accompanying drawings and the descriptionbelow. Other features and advantages of the subject matter describedherein will be apparent from the description and drawings, and from theclaims.

DESCRIPTION OF DRAWINGS

The accompanying drawings, which are incorporated in and constitute apart of this specification, show certain aspects of the subject matterdisclosed herein and, together with the description, help explain someof the principles associated with the disclosed implementations. In thedrawings,

FIG. 1A and FIG. 1B show examples of sample measurement cells includinga sample volume and a validation cell;

FIG. 2 is a process flow diagram illustrating aspects of a methodconsistent with implementations of the current subject matter;

FIG. 3 is a diagram showing an example of a sample measurement cellconfigured for multiple passes of a light beam through a validation celland a sample volume;

FIG. 4 is a diagram showing an example of an analytical system includinga free gas space;

FIG. 5 is a diagram showing an example of a hollow core optical lightguide configured as a validation cell;

FIG. 6 is a diagram showing an example of a hollow core optical lightguide configured as a validation cell;

FIG. 7 is a diagram showing an example of a hermetically sealed laserpackage configured as a validation cell;

FIG. 8 is a graph comparing absorbance of low pressure water vapor in avalidation cell with absorbance of pure methane and differentconcentrations of water vapor in a sample measurement cell;

FIG. 9 is a graph showing the total absorbance line shapes for lowpressure water vapor in a reference gas cell and differentconcentrations of water vapor in methane background in a samplemeasurement cell;

FIG. 10 is a process flow chart illustrating features of a method fordetermining whether a spectroscopic validation failure has occurred;

FIG. 11 is a process flow chart illustrating features of a method fordetermining whether adjusting operating and/or analytical parameters ofa laser absorption spectrometer to correct a validation state of thelaser absorption spectrometer;

FIG. 12 is a process flow chart illustrating features of a method fordetermining whether a spectroscopic validation failure has occurred;

FIG. 13 is a graph illustrating two spectral absorption charts showingan example of adjusting a middle operating current of a laser lightsource to shift a test curve to align with a stored reference curve; and

FIG. 14 is a graph illustrating two spectral absorption charts showingan example of adjusting one or more operating parameters of a laserlight source and/or signal converting parameters to correct a test curveshape to reduce the difference between the test curve shape and areference curve shape.

When practical, similar reference numbers denote similar structures,features, or elements.

DETAILED DESCRIPTION

To address the above noted and potentially other issues with currentlyavailable solutions, one or more implementations of the current subjectmatter provide methods, systems, articles of manufacture, and the likethat can, among other possible advantages, provide an integratedmeasurement fidelity validation capability into an optical absorptioncell of a spectrometer. The only gas needed for field validation is asuitable, easy to obtain, cost effective, zero gas. As used herein, theterm “zero gas” refers to the contents of a sample measurement cell thathave a negligible, or alternatively a well-characterized, absorbance oflight overlapping a target spectral feature of one or more targetanalytes to be detected in a sample gas mixture. An in-line validationcell contains a reference gas, and is positioned such that light from alight source passes through both of the validation cell and the samplemeasurement cell on its way to a detector that quantifies a receivedlight intensity. Such an arrangement can eliminate the need forcomplicated and expensive devices to tightly control temperature andflow as is required for instrument validation when using permeationdevices or dilution of pre-mixed trace gas blends from compressed gascylinders. The zero gas can be, for example, noble gases, nitrogen gas(N₂), hydrogen gas (H₂), oxygen gas (O₂), any homo-nuclear diatomic gas,any gas which has negligible absorption at the chosen wavelength of thetrace analyte measurement of interest, any gas which does not containthe trace analyte of interest at levels detectable by the instrument,vacuum, or the like. Such a zero gas can be further conditioned byremoving any potential trace gas contamination through use of a suitablefilter or scrubber, to levels below the detection limit of the analyzer.Filters reducing total hydrocarbons, moisture, CO₂, CO and othercontaminants to low single digit ppb levels, or lower can be used insome implementations. Chemically reactive scrubbers that reduce thetrace analyte concentration to below the instrument's detection levelcan be used in some implementations. Examples of such scrubbers aredescribed in co-owned U.S. Pat. No. 7,829,046. Driers reducing the totalmoisture concentration to levels below the instrument detection limitcan be used in some implementations. The zero gas can, in someimplementations, be a vacuum, or alternatively, a gas mixture having aknown composition with a well-characterized spectral response at thewavelength or wavelengths of interest for a spectroscopic analysis.

Implementations of the current subject matter can provide improvedfidelity between a validation measurement and a sample measurement byplacing the validation cell in line with the sample measurement cell.This configuration allows measurement of the trace gas concentration inthe sample measurement cell and in the validation cell simultaneously,as the sum of trace gas concentrations in the sample measurement celland the validation cell. In this novel optical arrangement forquantitative trace gas spectroscopy, a single optical measurement beaminteracts spatially and temporally with an unchanging gas volume, thesame optically reflective and transmissive surfaces, and the samedetector whenever it measures a trace gas concentration or a zero gasconcentration in the sample measurement cell while simultaneouslypassing through the trace gas concentration in the validation cell.

A suitable data algorithm can compare one or more stored referencespectral scans collected with zero gas in the sample measurement cell(thereby reflecting absorbance of only the reference gas in thevalidation cell) with a measured composite trace gas scan collected witha sample gas in the sample measurement cell (thereby reflectingabsorbance of gases in both the sample measurement cell and thevalidation cell) to derive the trace gas concentration in the samplemeasurement cell. Comparing the zero gas validation cell reading andspectral traces with one or more electronically stored referencespectral traces collected during instrument calibration can be used tovalidate the fidelity of the measurement of the sample gas.

Additionally, analyzing the validation cell spectral traces andconcentration measurement without an absorbing gas in the samplemeasurement cell allows for automatic reconstruction of a calibrationstate of the instrument, for example as described in co-pending andco-owned provisional application Ser. No. 61/405,589. In contrast,previously available approaches employing a validation cell that isoutside of the measurement beam path and/or that uses a separatedetector and separate optical components can lead to different anddifficult to quantify factors influencing one or more components of thetwo separate analytical units. For example, characteristics of thevalidation cell and measurement cell, reference detector and measurementdetector, or one or more of the optical components serving either of thereference or sample analytical paths, etc. can vary independently overtime. The current subject matter can also provide advantages in reducingthe number of optical surfaces that can degrade the signal to noiseratio and detection sensitivity of an instrument.

FIG. 1A and FIG. 1B depict examples of spectroscopic gas analyzers 100and 101 illustrating features consistent with at least someimplementations of the current subject matter. A light source 102provides a continuous or pulsed beam of light 104 that is directed to adetector 106. The beam of light 104 passes through a sample measurementcell 112 that includes a sample volume and a segregated, sealedvalidation cell 114 that contains a static, known amount of a referencegas. The validation cell 114 can be maintained at a stable temperatureto maintain a stable gas pressure of the reference gas in the fixedvolume validation cell 114. In a further implementation, the temperatureof the reference gas in the validation cell 114 can be measured tocompute the pressure in the validation cell 114 by application of theideal gas law,

PV=nRT  (1)

where P is the pressure within the validation cell 114, V is the (knownand constant) volume of the validation cell 114, T is the measuredtemperature in the validation cell 114, n is the (known) number of molesof the reference gas in the validation cell 114, and R is the gasconstant (8.314472 J·mol⁻¹·K⁻¹).

The measured temperature and derived pressure inside the validation cell114 can be used to numerically correct the trace gas spectrum in thevalidation cell 114 with respect to a previously measured and storedcalibration state. This numerical correction can be accomplished bycomparing a spectral trace measured with zero gas in the samplemeasurement cell 112 with a previously stored reference spectral traceand the respective measured temperature and derived pressure that arestored in an electronic medium at the time of calibration.

Throughout this disclosure, the term “validation cell” is used to referto a sealed volume containing a known quantity of at least one targetanalyte. It can alternatively be referred to as a reference gasreservoir or reference gas volume. The light source 102 can include, forexample, one or more of a tunable diode laser, a tunable semiconductorlaser, a quantum cascade laser, a vertical cavity surface emitting laser(VCSEL), a horizontal cavity surface emitting laser (HCSEL), adistributed feedback laser, a light emitting diode (LED), asuper-luminescent diode, an amplified spontaneous emission (ASE) source,a gas discharge laser, a liquid laser, a solid state laser, a fiberlaser, a color center laser, an incandescent lamp, a discharge lamp, athermal emitter, and the like. The detector 106 can include, forexample, one or more of an indium gallium arsenide (InGaAs) detector, anindium arsenide (InAs) detector, an indium phosphide (InP) detector, asilicon (Si) detector, a silicon germanium (SiGe) detector, a germanium(Ge) detector, a mercury cadmium telluride detector (HgCdTe or MCT), alead sulfide (PbS) detector, a lead selenide (PbSe) detector, athermopile detector, a multi-element array detector, a single elementdetector, a photo-multiplier, and the like.

The sample measurement cell 112 can include a gas inlet 116 and a gasoutlet 120 through which a sample of gas to be analyzed can be passedinto and out of the sample volume, respectively. A controller 122, whichcan include one or more programmable processors or the like, cancommunicate with one or more of the light source 102 and the detector106 for controlling the emission of the beam of light 104 and receivingsignals generated by the detector 106 that are representative of theintensity of light impinging on the detector 106 as a function ofwavelength. In various implementations, the controller 122 can be asingle unit that performs both of controlling the light source 102 andreceiving signals from the detector 106, or it can be more than one unitacross which these functions are divided. Communications between thecontroller 122 or controllers and the light source 102 and detector 106can be over wired communications links, wireless communications links,or any combination thereof.

The sample measurement cell 112 can also include at least one opticalfeature for transmitting and/or reflecting the beam of light 104 betweenthe light source 102 and the detector 106. Such optical components canadvantageously have a low absorbance of light at the wavelength or rangeof wavelengths at which the light source 102 emits the beam of light104. In other words, a reflective optical component would advantageouslyreflect more than 50% of the incident light at the wavelength or in therange of wavelengths, in a single reflection, an optical light guidewould advantageously transmit more than 2% of the incident light, and awindow would advantageously be anti-reflection coated and transmit morethan 95% of the incident light at the wavelength or in the range ofwavelengths. In the example configuration illustrated in FIG. 1A, thebeam of light 104 first passes through a first window 124 to enter thevalidation cell 114, a second window 126 to enter the sample volume ofthe sample measurement cell 112, and a third window 130 to reach thedetector 106. Other configurations are within the scope of the currentsubject matter. For example, as shown in FIG. 1B, instead of the thirdwindow 130 that is shown in FIG. 1A, a mirror 132 can reflect the beamof light 104 back through the sample volume of the sample measurementcell 112 and the validation cell 114 while also passing a second timethrough the second window 126 and the first window 124. Other possibleconfigurations include the first window 124 being formed as part of alarger mirror that causes the beam of light 104 to reflect multipletimes through the sample volume of the sample measurement cell 112 andthe validation cell 114 before impinging upon the detector 106.

FIG. 2 shows a process flow chart 200 illustrating features of a methodconsistent with at least one implementation of the current subjectmatter. At 202, first light intensity data are received. The first lightintensity data quantify a first intensity of light received at adetector 106 from a light source 102 after the light, which can be alight beam 104, has passed at least once through each of a reference gasin a validation cell 114 and a zero gas. The reference gas includes aknown amount of an analyte compound. The light source 102 emitting thelight in a wavelength range that comprises a spectral absorbance featureof the analyte compound. The zero gas can, as noted above, be a gas orgas mixture or a complete or partial vacuum having at least one of knownand negligible first light absorbance characteristics that overlapsecond light absorbance characteristics of a trace analyte within arange of wavelengths produced by the light source. The zero gas can alsoinclude a spectrally absorbing gas having well known absorptioncharacteristics that have been characterized and stored in an electronicmedium in retrievable format, in the measured wavelength region. At 204,a valid state of the analytical system is verified by determining thatthe first light intensity data do not deviate from a stored data set bygreater than a pre-defined threshold deviation. The stored data setrepresent at least one previous measurement collected during a previousinstrument validation process of the analytical system that includes atleast the light source 102 and the detector 106. Second light intensitydata are received at 206. The second light intensity data quantify asecond intensity of the light received at the detector from the lightsource after the light passes at least once through each of thereference gas in the validation cell and a sample gas containing anunknown concentration of the analyte. At 210, a concentration of theanalyte compound in the sample gas is determined by correcting thesecond light intensity data to account for a known absorbance of thelight in the validation cell. In some implementations, the correctingcan include subtracting a reference spectrum generated based on firstintensity data from a validation mode data set from a sample spectrumgenerated during the sample analysis mode.

A sample gas can be directed into a path 104 of the light during asample analysis mode and a zero gas can be directed into the path 104 ofthe light during a validation mode. The sample gas and zero gas can bedirected into the analysis volume of the sample measurement cell 112,for example using a flow switching apparatus that can in variousimplementations include one or more valves, flow controllers, vacuumpumps, or the like that can be controlled to provide a desired gas inthe beam path of the light from the light source 102. A controller 122that comprises a programmable processor can receive the first lightintensity data and the second light intensity data and can perform theverifying of the valid state. The stored data set can be used by thecontroller for automated recovery of the original calibration state ofthe spectrometer, for example as described in co-pending and co-ownedprovisional application Ser. No. 61/405,589, which has been incorporatedherein by reference and in greater detail below.

FIG. 3 is a diagram of an optical cell 300 that is consistent with oneor more implementations of the current subject matter. The optical cell300 includes a validation cell 114 and a sample volume of a samplemeasurement cell 112. A barrier 306 formed of an optically transparentmaterial can divide the validation cell 114 and the sample measurementcell 112 portions of the optical cell 300. The barrier 306 can beoptically coated on both sides with an anti-reflective coating 310 ofsingle or multi-layer material, that can be made from oxides, such asfor example SiO₂, TiO₂, Al₂O₃, HfO₂, ZrO₂, Sc₂O₃, NbO₂ and Ta₂O₅;fluorides, such as for example MgF₂, LaF₃, and AlF₃; etc. and/orcombinations thereof. The optical antireflection coating can bedeposited by a technique such as for example electron beam evaporation,ion assisted deposition, ion beam sputtering, and the like. The opticalcell 300 can be contained between a first reflector 312 and a secondreflector 314, each of which can have a curved surface and/or a flatsurface that includes a coating of a highly reflective material 316,such as for example metallic materials (e.g. Au, Ag, Cu, steel, Al, andthe like), one or more layers of transparent dielectric opticalmaterials (e.g. oxides, fluorides, etc.), and/or a combination ofmetallic and dielectric optical materials. The reflectors can optionallybe made entirely of dielectric materials, without any metal reflector.The first reflector 312 can include an outer coating of theanti-reflective material 310 as well as at least a gap or opening in thecoating of the highly reflective material 316 that can be coated withthe anti-reflective material 310 so that an incoming beam 320 of lightcan pass into the optical cell 300 in the space between the firstreflector 312 and the second reflector 314. The incoming beam 320 can begenerated by a light source (not shown in FIG. 3).

After entering the optical cell, the incoming beam 320 of light can bereflected a plurality of times between the first reflector 312 and thesecond reflector 314 before exiting the optical cell 300 as an outgoingbeam of light 322, optionally through the same area of the coating ofanti-reflective material 310 on the inner surface of the first reflector312. In this manner, the beam of light passes multiple times through thesample measurement cell 112 as well as through the validation cell 114.A sample gas can be admitted into the sample measurement cell 112,optionally via a sample inlet 324, and removed from the samplemeasurement cell 112, optionally via a sample outlet 326. One or morevalves or other flow controlling devices can be coupled to the sampleinlet 324 to switch between flow of a sample gas and a zero gas into thesample measurement cell 112. The sample gas can be admitted to thesample volume of the sample measurement cell 112 for measurements in asample analysis mode and the zero gas can be admitted to the samplevolume of the sample measurement cell 112 for measurements in avalidation mode. It should be noted that the optical cell 300 is merelyan example configuration. Other configurations of the optical cell 300are also within the scope of the current subject matter. For example,the first reflector 312 and the second reflector 314 can be positionedopposite one another with a free gas space between them. The validationcell 114 can be positioned as shown in FIG. 3. With such aconfiguration, the concentration of one or more analytes in the gasoccupying the free gas space can be analyzed in a similar manner asdescribed herein.

In some implementations, a metal alloy, such as for example AL 4750TH(available from Allegheny Ludlum of Pittsburgh, Pa.), can be used as aspacer between the windows and mirrors, which can be made in someexamples of BK-7™ optical glass (available from Esco Products of OakRidge, N.J.). It can be advantageous to choose window and spacermaterials that have similar thermal expansion characteristics. In someimplementations, mirror and window materials can be attached to spacermaterial by glass fitting, soldering, or some other technique capable offorming a very low permeation ultra-high vacuum seal that can, forexample, maintain a leak rate for He (helium) of less than approximately10⁻⁶ standard torr·cm³·sec⁻¹.

As noted above, other configurations of an analytical system are alsowithin the scope of the current subject matter. For example, asillustrated in the example of an open path analytical system 400 shownin FIG. 4, the sample gas and the zero gas need not be contained withina sample volume within an optical cell or a sample measurement cell.Such an open path analytical system 400 can include a validation cell114 that contains a sealed volume including a known amount of one ormore target analytes. The validation cell 114 can be positioned suchthat a beam of light 104 from a light source 102 passes at least oncethrough the validation cell 114 on its way to a detector 106. The pathof the light traverses a free gas space 402 or other volume that neednot be constrained within a container. The free gas space can at leastoccasionally experience passage of a sample gas containing the targetanalyte. For example, the path of the light can traverse an exhauststack or other open flow path of a refinery, power plant, factory, orthe like. The light also passes through the validation cell 114 beforereaching the detector 106 that quantifies light intensity, for exampleas a function of wavelength, of the light. A validation mode can includediverting the process gas from the free gas space 402 and replacing witha zero gas.

In some implementations, for example in the example system 500 shown inFIG. 5, a hollow core optical light guide 502 can be vacuum sealed withone or more sealing optical elements 504 that can include, but are notlimited to, flat components, curved components, diffractive components,and the like. The sealing optical elements 504 can, in someimplementations, transmit at least 95% of the incident light directedinto the light guide 502 and at least 95% of the light transmitted bythe light guide 502 back out of it. The sealed hollow core 506 of theoptical light guide 502 can contain a reference gas as describedelsewhere herein and thereby serve as a validation cell 114 throughwhich light from the light source 102 passes before reaching the samplemeasurement cell 112. The sealing optical elements 504, which caninclude but are not limited to antireflection-coated optical windows,light transmissive optical surfaces, and the like that provide a meansfor light to enter and exit the sealed hollow core 506 of the hollowcore optical light guide 502 while also optionally forming a leak tightgas seal between the sample stream and the outside world, can collimatelight emitted from a laser light source 102 into the optical light guide502 and collimate the light exiting the optical light guide 502 into thesample measurement cell 112, such as for example one of the variationsdiscussed herein or an equivalent.

The validation cell 114 within the hollow core 506 of the light guide502 can alternatively be used with non attached optical elementsfocusing the laser light into it and non attached optical focusingelements that focus the fiber transmitted light into the samplemeasurement cell 112, or a combination of attached and non attachedoptical elements. The optical focusing elements can optionally form allor part of a leak tight gas seal between the hollow core optical lightguide 502 and the outside world. A hollow core optical light guide 502can be constructed from one or more materials that can include but arenot limited to metal, glass, plastics, polytetrafluoroethylene (e.g.Teflon™ available from DuPont of Wilmington, Del.), Tygon (availablefrom the Saint Gobain Corporation of Courbevois, France), and the like,which can be used individually or in combination.

A hollow core optical light guide 502 can alternatively or in additionbe used as a sample measurement cell 112, for example in the system 600illustrated in FIG. 6. In the implementation illustrated in FIG. 4, thehollow core optical light guide 502 can have a gas inlet 116 and a gasoutlet 120, each hermetically sealed to the outside of the hollow coreoptical light guide 502 to allow sample gas or zero gas to be providedinto the sealed hollow core 506 of the optical light guide. Light can bepassed into the hollow core optical light guide 502 by means of asuitable optical focusing arrangement of the beam provided by a lightsource 102. Light travels through the hollow core optical light guide502 containing the sample gas, in a single direction. The light source102 and the detector 106 can be positioned at either end of the hollowcore optical light guide 502. In some implementations, a hollow coreoptical light guide 502 as described herein (e.g. for either or both ofa validation cell 114 and a sample measurement cell 112) can have aninternal open core dimension perpendicular to the light beam 104 smallerthan 3.5 mm and an internal open core dimension parallel to the lightbeam 104 greater than 0.1 mm.

In another implementation, both of the validation cell 114 and thesample measurement cell 112 can be contained within separate hollow corelight guides that are optically and, optionally, physically coupled toone another such that light passes through both a first hollow corelight guide containing the validation cell 114 and a second hollow corelight guide 502 containing the sample measurement cell 112.

In other implementations, the light source 102 can be a hermeticallysealed laser package, such as for example a butterfly package or a TOSApackage commonly used for telecommunications lasers. A hollow coreoptical light guide 502 can be hermetically sealed to the hermetic laserpackage of the light source 102 with the hollow core 506 open to theinterior of the hermetic laser package such that the hollow core 506 ofthe light guide 502 and the hermetic laser package form a sealed volumewithin which a reference gas as described elsewhere herein is containedto form a validation cell 114. In another variation, the hollow coreoptical light guide 502 can be hermetically sealed to the hermetic laserpackage with its hollow core sealed separately and filled with thereference gas similar to the configuration shown in FIG. 5 or providedwith flow-through capability via and inlet port 116 and outlet port 120to serve as a sample measurement cell 112 that can contain a sample gasor a reference gas as in FIG. 6

In another implementation, an example of which is illustrated by thesystem 700 of FIG. 7, a sealed volume 702 within a hermetically sealedlaser package 704 can serve as both the light source and a reference gasreservoir that functions as the validation cell. The hermetically sealedvolume 702 can be sealed by sealing optical elements 504 transmittingthe laser light, for example into the sample measurement cell 112. Thesealing optical elements can include, but are not limited to, flat,curved, fiber, refractive and diffractive components and combinations ofthese.

In at least some implementations, a validation cell 114 can be filledunder precisely and accurately controlled temperature and pressureconditions, using a neat analyte or a well-known mole fraction of theanalyte in a carrier gas mix. The reference gas can be filled into thevalidation cell 114, for example using a vacuum gas conditioning andfilling station. The vacuum filling station can provide a heat outcapability for the validation cell 114 to remove any unwanted moistureand other trace gases, before filling the validation cell 114 with aknown amount of trace gas, and optionally some amount of carrier gas.The validation cell 114 can be attached to the vacuum pumping station bymeans of a single tube connection or by means of two tube connectionsenabling gas streaming through the validation cell 114. The validationcell 114 can be disconnected from a filling station that provides thereference gas mixture or neat analyte in a manner that creates a longlasting, ultra high vacuum seal, for example using a cold fusing pinchoff operation. As used herein, the term neat refers to a preparation ofthe analyte without any diluting gas or other compound. For example, aneat preparation of water vapor in a validation cell 114 can be preparedby adding a known volume of liquid or gas phase water to an evacuatedcontainer.

An optical cell or measurement system, such as those described hereinand/or functional equivalents thereto that includes an integrated gascell, can permit preparation and long term stable preservation of anaccurate reference sample of a neat analyte or a trace analyte that ispresent at a known mole fraction in a suitable background gas. In someimplementations, such as for example when the reference gas sample inthe validation cell 114 is prepared gravimetrically, the trace gasconcentration in the validation cell 114 can be determined with respectto a NIST or other comparable traceable standard and/or certificationsfor a gas blend. The reference sample can be arranged directly in themeasuring light beam 104 of a spectrometer. In some implementations ofthe current subject matter, an ultra-high-vacuum, leak-tight validationcell 114 can be placed in series with a sample measurement cell 112 of aspectrometer such that a small total amount of an analyte can beprovided with no carrier gas. The reference sample can optionallyinclude multiple analytes, for example if the spectrometer is configuredfor measurement of multiple analytes.

In both the sample analysis mode and the validation mode, the beam 104of light from the light source 102 passes at least once through thevalidation cell 114 and interacts with all of the optical components ofthe analysis system before being detected and quantified by the detector106. In the validation mode, the sample volume of the sample measurementcell 112 can be flushed or otherwise filled with an opticallytransparent gas that lacks a significant absorbance of light at awavelength or in a range of wavelengths provided by the light source102. Alternatively, the sample volume of the sample measurement cell 112can be pumped to at least a partial vacuum condition such that little oradvantageously no molecules of the analyte or any other species thatsignificantly absorbs at the wavelength or in the range of wavelengthsis present in the sample volume of the sample measurement cell 112.Thus, in the validation mode, the beam 104 of light experiencesabsorbance primarily by molecules of the analyte contained in thevalidation cell 114. This absorbance can be detected by the samedetector 106 and under the same optical conditions as the absorbance fora gas sample in the sample measurement cell 112 when the spectrometer isoperated in sample analysis mode. In the sample analysis mode, thesample volume of the sample measurement cell 112 contains a sample gassuch that the beam 104 of light experiences absorbance by thosemolecules of the analyte contained in the validation cell 114 and thosemolecules of the analyte in the sample gas in the sample volume of thesample measurement cell 112.

An approach consistent with the currently described subject matter canensure that the validation measurement will always include any and allaging and contamination related issues that can impact the actualmeasurement of analyte concentration in a sample gas in the samplevolume. Use of a validation cell or other vessel or container for areference gas that is not contained in the actual measurement beam pathor that uses a different photo detector, different optical components,or the like may not as accurately characterize factors impacting themeasurement of a sample gas are thus likely to give a less usefulvalidation measurement of a spectrometer.

In at least some implementations, the light source 102, detector 106,and sample measurement cell can be part of a tunable diode laser (TDL)spectrometer or other spectrometer using a light source that is tunableto provide the beam of light with a narrow bandwidth wavelength that isscanned across a range of wavelengths. Alternatively, the light source102, detector 106, and sample measurement cell can be part of an opticalspectrometer using a broad band light source that provides the beam oflight.

The controller 122 can, as noted above, receive signals from thedetector 106 that are characteristic of the optical absorbance of thebeam of light 104 as it passes between the light source 102 and thedetector 106. In some implementations, an algorithm can includecomparing a reference spectrum obtained during a validation modemeasurement to an original reference gas calibration file for theinstrument. An acceptable correlation fit between the factorycalibration reference gas spectrum and the field obtained zero gasspectrum can indicate that no significant changes have occurred with thespectrometer and that measurement fidelity is maintained with respect tothe original spectrometer factory calibration. In this way, validationof the analyzer calibration can be completed using only one gas forzeroing the absorbance due to a sample gas (for example in a samplevolume). This approach simplifies field validation of an analyzer sinceonly a single zero gas is used and because a suitable zero gas, such asN₂, which does not absorb in the infra red spectral region, cangenerally be very easy to obtain and store. The current subject mattercan therefore dramatically improve on the typically used approach tofield validation of analyzers in which validation of the zero reading isdone using a suitable zero gas and validation of the span reading isdone using a span gas blend provided by a pre-mixed cylinder.

Integrating the validation cell into the reflector for the trace gasmeasurement cell can improve spectrometer cell compactness, signal tonoise ratio and detection sensitivity by reducing the number of opticalsurfaces compared to inserting a separate validation cell into thespectrometer beam path. Reducing the number of optical surfaces throughwhich the light beam passes reduces potential for optical fringes, thusimproving the spectrometer signal to noise ratio and detectionsensitivity. Integrating the validation cell eliminates need foralignment of a separate validation cell and maintains relative alignmentwith respect to the measurement cell over time and all environmentalconditions.

The reference trace gas concentration may be adjusted in the factory, asrequired for a specific application. Trace gas concentrations in thevalidation cell can be adjusted from 1 part per trillion (ppt) to 100%,as long as gas phase is being maintained under operating conditions. Theoperating temperature can be between −50 C to +200 C. The trace analytemay be stored in the validation cell at operating pressures between 1mbar and 5000 mbar. The trace analyte may be neat or may be blended intosuitable mixtures of carrier gases, which include but are not limited toN₂, O₂, air, H₂, Cl₂, other homo-nuclear diatomic gases, noble gases,CO₂, CO, hydrocarbon gases, hydrofluorocarbons (HFCs),chlorofluorocarbons (CFCs), fluorocarbons (FCs), and the like. Traceanalytes can be any gas phase component that has an optical absorbancefeature at a wavelength between about 100 nm and 20,000 nm. Analytesthat can be quantified using one or more aspects of the current subjectmatter include but are not limited to H₂O, H₂S, NH₃, HCl, C₂H₂, CO₂, CO,CH₄, C₂H₆, C₂H₄, O₂, and the like.

Additional advantages of the current subject matter can include theability to improve the robustness of laser frequency stabilizationmethods, for example from a tunable laser light source, which can leadto better tracking of target analyte absorbance peaks. For a sample gasstream that does not have a target analyte present at all times, it canbe difficult to verify that the laser frequency is sufficiently stableto isolate the target absorbance peaks. In one illustrative example, arefinery or manufacturing process can be monitored for oxygen (O₂)concentration spikes for safety control. Oxygen may only be present inthe stream under process upset conditions and in negligible amountsduring normal process operation. If the laser light source of aninstrument used for measuring oxygen to detect process upset conditionsexperiences a shift of the laser frequency during a prolonged periodwhen O₂ is not present in the sample stream, such an occurrence cannegatively impact the performance of the instrument when O₂ does occurduring a process upset. This can lead to erroneous readings andpotential failure of the instrument to properly warn of a safety hazard.

Because the target analyte is always present in the validation cell ininstruments consistent with the current subject matter, periodicvalidations of the laser frequency stability are readily performed sothat the instrument can be routinely maintained in an optimal readystate to detect process upsets such as described above. The validationcell will always provide the spectrometer with a detectable absorptionpeak, regardless of the analyte concentration in the sample gas stream.In this manner, a spectrometer utilizing a tunable laser light sourcecan lock the laser frequency to a suitable absorption peak at any time,not just when the analyte is present in the sample gas.

Locking the laser frequency to a suitable molecular absorption peak canprovide added operational robustness of the spectrometer againstenvironmental changes and potential aging of the laser light source.FIG. 8 and FIG. 9 show two graphs 700 and 800, respectively,illustrating aspects of peak tracking for measuring trace water vapor ina natural gas or hydrocarbon background. Analysis of such a system hasbeen previously described in co-owned U.S. Pat. Nos. 6,657,198,7,132,661, 7,339,168, 7,504,631, and 7,679,059 and in pending U.S.Patent Application Publication No. US2004/003877, all of whosedisclosures are incorporated herein by reference in their entireties. Inan example consistent with at least some implementations of the currentsubject matter, a validation cell 114 can be filled with neat watervapor at ultra low pressure, such as for example 1 ton. The graph 800 ofFIG. 8 shows that the absorption peak of the neat water vapor 802 in thevalidation cell 114 is much sharper than the absorption spectra of 100%methane gas 804, 50 ppm of water vapor 806, 100 ppm of water vapor 810,or 150 ppm of water vapor 812 at ambient pressure.

As illustrated in the graph 900 of FIG. 9, the sharp absorption peak ofthe neat water vapor inside the validation cell 114 can be used forreliable peak tracking for concentrations of water vapor in the samplegas stream of at least 0 ppm 902, 50 ppm 904, 100 ppm 906, and 150 ppm910. The peak 902 at 0 ppm is entirely due to absorbance by the watermolecules in the validation cell 114. Subtracting the validation cellspectrum from a sample gas spectrum or otherwise correcting for theabsorbance by water vapor in the validation cell 114 can be used toresolve the water vapor concentration in the sample gas, for examplethat contained in the sample measurement cell 112 during a sampleanalysis mode.

An alternative to using a zero gas in the free gas space 402 of an openpath analytical system 400 or in a contained sample volume of a samplemeasurement cell 112 of a system that includes a defined sample volumecan involve making at least two measurements for a given sample gas attwo different temperatures. Because the line shape of the absorbancefeature of an analyte can be a function of the pressure of the gas inthe validation cell 114 as a consequence of collisional broadeningeffects, varying the temperature (and as a result the pressure of thesealed volume within the validation cell 114) can lead to the knownamount of the analyte in the validation cell 114 creating distinct anddistinguishable line shapes that vary as a function of the temperature.As such, by controlling the temperature of the validation cell 114 totwo or more known temperatures and comparing the resulting line shapesof the absorbance curves to those collected at a previous time, forexample when the instrument is newly calibrated, an indication of thecurrent validation state of the instrument can be readily obtainedwithout the use of any zero gas.

It should be noted that, while various implementations presented hereindescribe sealed validation cell configurations, the current subjectmatter also encompasses variations in which the validation cell has aflow-through configuration in which in which a reference gas iscontinuously or semi-continuously passed through the validation cell.This arrangement may be advantageous for reference gases that can beprepared and stably stored, for example in compressed gas cylinders.Alternatively, a permeation or diffusion source that generates aconsistent mass of a trace analyte over time can be used in conjunctionwith a stream of carrier gas to generate a flowing reference gas for usein such a validation cell.

Using a validation cell 114 as described herein, implementations of thecurrent subject matter can alternatively or in addition provide anautomated, algorithmic approach that frequency stabilizes a tunablelaser light source of a laser absorption spectrometer to improve therobustness of quantitative trace gas concentration measurements bycompensating and/or correcting for short term ambient changes inanalytical conditions as well as long term drift and aging effects thatmay adversely affect performance of the laser absorption spectrometer.

Real time laser frequency stabilization can be achieved in someimplementations by comparing actual absorption spectra collected at thetime of calibration of an instrument with absorption spectra collectedin the field for gas samples without need for providing a bottledreference gas of uncertain concentration stability or using a separatelaser frequency stabilization circuit. Aside from increased cost andcomplexity, a separate laser frequency stabilization circuit can alsointerfere with the actual measurement. The current subject matter canreduce cost and complexity while also improving operational robustnessand measurement fidelity and reproducibility compared to previouslyavailable spectroscopy approaches based on frequency stabilization ontoa molecular line that is not part of the actual measurement. Using anapproach as described herein, information about the performance of alaser spectrometer relative to a previous known or calibrated state canbe obtained across the breadth of a scanned wavelength range of atunable or scannable laser light source. Such an approach can providesubstantial improvement relative to techniques that focus only on peaklocation rather than an entire absorption curve shape over a broaderrange of wavelengths.

FIG. 10 shows a process flow chart 1000 illustrating features of amethod that enables determination of a validation failure of anabsorption spectrometer. At 1002, light intensity data quantifyingintensity of a light beam 104 or other radiation, light, etc. generatedby a light source 102 and received at a detector 106 during a validationmode of an absorption spectrometer are received, for example by acontroller 122, a programmable processor-based device, or the like. Thevalidation mode can, as discussed above, include causing the light topass at least once through each of a zero gas and a reference gas, forexample a reference gas contained within a validation cell 114 thatincludes a known amount of a target analyte. The zero gas can be asdiscussed above and can include at least one of known and negligiblefirst light absorbance characteristics within a range of wavelengthsproduced by the light source. At 1004, the light intensity data arecompared with a stored data set representing at least one previousmeasurement in the validation mode. A validation failure is determinedto have occurred at 1006 if the first light intensity data and thestored data set are out of agreement by more than a predefined thresholdamount.

The light source 102 can optionally include a tunable or scannable laserof a laser absorption spectrometer, and the stored data set can includea reference harmonic absorption curve of the laser absorptionspectrometer. The reference harmonic absorption curve has a referencecurve shape and includes at least one of a first or higher orderharmonic signal of a reference signal generated by the detector 106 inresponse to light passing from the light source 102 through thereference gas in the validation cell 114. The reference harmonicabsorption curve can have been previously determined for the laserabsorption spectrometer in a known or calibrated state. The lightintensity data can include a test harmonic absorption curve having atest curve shape that is collected using the reference gas containedwithin the validation cell 114 of the absorption spectrometer and zerogas in the sample measurement cell 112 or free gas space 402. Thepredefined threshold amount can include a predefined allowed deviationbetween the test curve shape and the reference curve shape.

FIG. 11 shows a process flow chart 1100 illustrating additional featuresconsistent with an implementation of the current subject matter. At1102, one or more reference harmonic absorption curves that can beobtained through analysis of one or more reference gas mixtures by alaser absorption spectrometer is/are retrieved, for example from localor networked data storage. The one or more reference harmonic absorptioncurves are previously obtained through analysis of one or more referencegas mixtures by a laser absorption spectrometer, for example at factorycalibration or at another time when the laser absorption spectrometer isin a well-calibrated state, and stored for later retrieval. At 1104, atest harmonic absorption curve is compared with the at least one of theone or more reference harmonic absorption curves to detect a differencebetween the respective curve shapes that exceeds a predefined alloweddeviation. At 1106, the operating and/or analytical parameters of thelaser absorption spectrometer are adjusted to correct the test harmonicabsorption curve to reduce the detected difference between the testharmonic absorption curve shape and the reference harmonic absorptioncurve shape. In other words, after adjusting of the one or moreoperating and/or analytical parameters of the laser absorptionspectrometer, a subsequent test harmonic absorption curve more closelyresembles the reference harmonic absorption curve. Optionally, at 1110,a field validation metric of the laser absorption spectrometer can bepromoted. The field validation metric can include at least one of thedifference between the test curve shape and the reference curve shape,an identification of the one or more operating and analytical parametersthat were adjusted, and a value by which the one or more operating andanalytical parameters were adjusted.

The adjusting of the one or more operating and/or analytical parametersof the laser absorption spectrometer to reduce the detected differencebetween the test harmonic absorption curve shape and the referenceharmonic absorption curve shape can be performed by a variety ofapproaches. In one implementation, an iterative approach can be used. Inone non-limiting implementation, one of several potential operatingand/or analytical parameters of the laser absorption spectrometer can beadjusted and a new test harmonic absorption curve generated by the laserabsorption spectrometer. Adjustments to the selected parameter cancontinue with successive generation of new test harmonic absorptioncurves until a setting of maximum improvement in the difference betweena test harmonic absorption curve and the reference harmonic absorptioncurve is obtained. Then another parameter can be iteratively adjusted ina similar manner until each parameter has been so adjusted. Anyalgorithm usable for iteratively converging to a multi-variate solutioncan be used.

The exact shape of the test harmonic absorption curve, and theconcentration calculation of the one or more target analytes for whichthe laser absorption spectrometer is configured to analyze can dependcritically upon the laser frequency behavior. The laser frequencybehavior can be affected by one or more operating and environmentalparameters that can include, but are not limited to the centerfrequency, the ramp current, the modulation current, and otherparameters of the laser light source as well as one or more parametersof the sample cell, detector, demodulator, and the like. At least theoperating temperature and the operating current of the laser lightsource 102 can affect the center frequency of the laser light source102. The particular frequency changes caused by changes in drive and/ormodulation current, temperature, and the like can be quite specific toeach individual laser light source 102.

A curve correlation algorithm according to implementations of thecurrent subject matter can generate an error signal whenever the laserfrequency changes, (i.e. if the same reference gas that was used torecord the original reference trace is periodically analyzed). Thereference harmonic absorption curve can be stored once, when theanalyzer receives its original calibration in the factory. Alternativelyor in addition, the reference harmonic absorption curve can be updatedperiodically using a differential spectroscopy approach, for example asdescribed in co-owned and co-pending U.S. patent application Ser. No.12/763,124 to adjust for stream changes, while maintaining a basicreference from the original calibration.

Upon receiving an error signal, an optimization algorithm can engage toadjust or otherwise reset one or more operating and analyticalparameters of the laser absorption spectrometer, which can include butare not limited to laser temperature, operating current, modulationcurrent, ramp current, ramp current curve shape during the scan, andother signal detection and conversion parameters, to automaticallyreconstruct the exact harmonic absorption curve shape as was originallystored during factory calibration.

In an implementation illustrated in the process flow chart 1200 of FIG.12, a processor such as a controller 122 can at 1202 receive first lightintensity data of a light beam received at a detector during a firstphase of a validation mode and second light intensity data of the lightbeam received at the detector during a second phase of the validationmode. The validation cell 114 can be maintained at a first temperatureduring the first phase and at a second temperature during the secondphase. At 1204, it can be determined that a first line shape of thefirst light intensity data and a second line shape of the second lightintensity data deviate by more than a threshold amount from a storeddata set. The stored data set can include previously recorded lineshapes for the analyte in the validation cell 114 at the firsttemperature and the second temperature, respectively. Upon determiningthat an above-threshold deviation exists, an alert can be promoted at1206 to indicate that a validation failure has occurred. The promotingof the alert can include one or more of a visible or audible alarm, analert displayed on a display screen, a transmitted electronic messagesuch as a SMS message or an electronic mail message, a facsimile oraudible message over a telephone line or cellular phone link, or anyother method for indicating to a local and/or remote user the failure ofthe validation process.

Another alternative validation method that does not require the use ofzero gas in the sample measurement cell 112 or free space 402 is todecompose the total spectra measured during sample analysis into spectraof the reference gas in the validation cell 114, spectra of the targetanalyte in the sample stream or sample gas contained with the samplemeasurement cell 112 or in the free space 402 through which the beam 104from the light source passes on its way to the detector 106, and thespectra of the background. The decomposition can be based onchemometrics or multivariable linear regression to find the best linearcombination of the reference spectra for the components of the referencegas in the validation cell 114, target analyte in the sample measurementcell 112 or open space 402, and background components in the samplemeasurement cell 112 or open space 402. All reference spectra can berecorded during calibration of the analyzer under laboratory or othercomparably controlled conditions. In this manner, the validation can bedone simultaneously with the sample analysis, removing the blind timefor zero gas validation and saving the components switching betweensample gas and zero gas.

FIG. 13 and FIG. 14 show two examples of dynamic corrections to acalibration state of a spectrometer using sample data. The referencecurve 1302 shown in the top and bottom panels of FIG. 13 is obtainedwith a tunable diode laser spectrometer for a reference gas mixturecontaining approximately 25% ethane and 75% ethylene. The test curve1304 shown on the top panel of FIG. 13 is obtained using the samespectrometer after some time had passed for a test gas mixturecontaining 1 ppm acetylene in a background of approximately 25% ethaneand 75% ethylene. Acetylene has a spectral absorption feature in therange of about 300 to 400 on the wavelength axis of the charts in FIG.13. In an example in which drift and/or other factors affect thespectrometer performance over time, the adjusted test curve 1306 can beshifted (for example to the left as shown in FIG. 2) compared with thereference curve 1302. Absent a correction to the test curve, themeasured concentration of acetylene from the spectrometer would be −0.29ppm instead of the correct value of 1 ppm.

According to an approach consistent with implementations of the currentsubject matter, the amount of the test curve drift can be identified bycomparing the test and reference curves in a portion of the spectrumoutside of the area where the acetylene absorption feature occurs (i.e.the region between about 20-260 on the wavelength axis). The lasermiddle operating current can be adjusted to shift the adjusted testcurve 1306 back to align up with the reference curve 1302 as shown inthe bottom panel of FIG. 13. After the adjustment, the measuredconcentration of acetylene from the spectrometer is 1 ppm.

The reference curve in the top and bottom panels of FIG. 14 is alsoobtained with a tunable diode laser spectrometer for a reference gasmixture containing approximately 25% ethane and 75% ethylene. The testcurve 1404 on the top panel of FIG. 14 was obtained for a test gasmixture containing 1 ppm acetylene in a background of approximately 25%ethane and 75% ethylene. As shown in the top panel of FIG. 14, the testcurve shape is distorted relative to the shape of the reference curve1402 due to drift or other factors affecting performance of the laserabsorption spectrometer over time. If the test curve 1404 is notcorrected, the measured concentration of acetylene in the test gasmixture determined by the spectrometer can be, for example, 1.81 ppminstead of the true concentration of 1 ppm. The bottom panel of FIG. 14shows the adjusted test curve

According to an approach consistent with implementations of the currentsubject matter, the amount of test curve distortion can be identifiedand/or corrected for by comparing one or more sections of the test curve1404 and the reference curve 1402 in one or more portions of thespectrum outside of the area where the acetylene absorption featureoccurs (i.e. the regions between about 20-260 and 400-500 on thewavelength axis). The laser operating parameters and signal convertingparameters can be adjusted to correct the shape of the adjusted testcurve 1406 to more closely resemble the shape of the reference curve1402. After the adjustment, the measured concentration of acetylene fromthe spectrometer returns to 1 ppm.

The approaches illustrated in FIG. 13 and FIG. 14 use a referenceharmonic spectrum collected for a sample having a background compositionconsistent with that expected to be present under analytical conditionsduring which the target analyte (acetylene) is to be quantified. In analternative or additional implementation, the reference harmonic spectracan be selected to contain one or more background absorption peaks thatdo not change with background compositions. In an alternative oradditional implementation, the reference harmonic spectrum can beconstructed from reference absorption spectra of individual backgroundspecies.

As described and illustrated, implementations of the current subjectmatter can consider substantially more information regarding the exactshape of a reference harmonic absorption curve than is typically used inpeak locking. Previously available laser control loops are generallylimited to only stabilizing or tracking the laser frequency and/or peakposition (i.e. location of the peak of a spectral feature in thedigitized scan range of the measurement).

The approach described herein can be applicable to any laser absorptionspectrometer that includes a tunable laser source, including but notlimited to direct absorption spectrometers, harmonic absorptionspectrometers, differential absorption spectrometers, etc. For a directabsorption spectrometer, the measurement of target analyteconcentrations can be performed without using a harmonic conversion ordemodulation of the signal obtained from the detector. However, periodicor continuous recalibration of the laser light source, detector, etc.can be performed using a calibration circuit, etc. that makes use of aharmonic signal obtained from the detector signal.

In another implementation, the calibration state of a harmonicabsorption spectrometer can be validated using different operatingparameters, including but limited to the modulation frequency, rampfrequency, etc., than are used in identifying and/or quantifying atarget analyte. Use of larger modulation frequencies can increase thesignal to noise ratio of an absorption feature of a target analyte byrelatively reducing the impact of absorption by the backgroundcomposition of a gas mixture. However, as the current subject matter canmake use of information obtained from all absorption features that occuracross a laser scan range in verifying agreement between a test harmonicabsorption curve and a reference harmonic absorption curve, it can beadvantageous to collect both the test and reference harmonic absorptioncurves under conditions that lead to a more complicated spectrum so thatadditional features are available to be matched between the test andreference harmonic absorption curves.

One or more aspects or features of the subject matter described hereincan be realized in digital electronic circuitry, integrated circuitry,specially designed application specific integrated circuits (ASICs),field programmable gate arrays (FPGAs) computer hardware, firmware,software, and/or combinations thereof. These various aspects or featurescan include implementation in one or more computer programs that areexecutable and/or interpretable on a programmable system including atleast one programmable processor, which can be special or generalpurpose, coupled to receive data and instructions from, and to transmitdata and instructions to, a storage system, at least one input device,and at least one output device.

These computer programs, which can also be referred to as programs,software, software applications, applications, components, or code,include machine instructions for a programmable processor, and can beimplemented in a high-level procedural and/or object-orientedprogramming language, and/or in assembly/machine language. As usedherein, the term “machine-readable medium” refers to any computerprogram product, apparatus and/or device, such as for example magneticdiscs, optical disks, memory, and Programmable Logic Devices (PLDs),used to provide machine instructions and/or data to a programmableprocessor, including a machine-readable medium that receives machineinstructions as a machine-readable signal. The term “machine-readablesignal” refers to any signal used to provide machine instructions and/ordata to a programmable processor. The machine-readable medium can storesuch machine instructions non-transitorily, such as for example as woulda non-transient solid state memory or a magnetic hard drive or anyequivalent storage medium. The machine-readable medium can alternativelyor additionally store such machine instructions in a transient manner,such as for example as would a processor cache or other random accessmemory associated with one or more physical processor cores.

To provide for interaction with a user, one or more aspects or featuresof the subject matter described herein can be implemented on a computerhaving a display device, such as for example a cathode ray tube (CRT) ora liquid crystal display (LCD) or a light emitting diode (LED) monitorfor displaying information to the user and a keyboard and a pointingdevice, such as for example a mouse or a trackball, by which the usermay provide input to the computer. Other kinds of devices can be used toprovide for interaction with a user as well. For example, feedbackprovided to the user can be any form of sensory feedback, such as forexample visual feedback, auditory feedback, or tactile feedback; andinput from the user may be received in any form, including, but notlimited to, acoustic, speech, or tactile input. Other possible inputdevices include, but are not limited to, touch screens or othertouch-sensitive devices such as single or multi-point resistive orcapacitive trackpads, voice recognition hardware and software, opticalscanners, optical pointers, digital image capture devices and associatedinterpretation software, and the like. A computer remote from ananalyzer can be linked to the analyzer over a wired or wireless networkto enable data exchange between the analyzer and the remote computer(e.g. receiving data at the remote computer from the analyzer andtransmitting information such as calibration data, operating parameters,software upgrades or updates, and the like) as well as remote control,diagnostics, etc. of the analyzer.

The subject matter described herein can be embodied in systems,apparatus, methods, and/or articles depending on the desiredconfiguration. The implementations set forth in the foregoingdescription do not represent all implementations consistent with thesubject matter described herein. Instead, they are merely some examplesconsistent with aspects related to the described subject matter.Although a few variations have been described in detail above, othermodifications or additions are possible. In particular, further featuresand/or variations can be provided in addition to those set forth herein.For example, the implementations described above can be directed tovarious combinations and subcombinations of the disclosed featuresand/or combinations and subcombinations of several further featuresdisclosed above. In addition, the logic flows depicted in theaccompanying figures and/or described herein do not necessarily requirethe particular order shown, or sequential order, to achieve desirableresults. Other implementations may be within the scope of the followingclaims.

1. An analytical system comprising: a validation cell positioned suchthat light generated by a light source passes through the validationcell at least once in transmission of the light from the light source toa detector, the validation cell containing a reference gas comprising aknown amount of an analyte compound, the light source emitting the lightin a wavelength range that comprises a spectral absorbance feature ofthe analyte compound; and a controller to perform an instrumentvalidation process and a sample analysis process, the instrumentvalidation process comprising: receiving first light intensity data thatquantify a first intensity of the light received at the detector whilethe light passes at least once through each of the reference gas in thevalidation cell and a zero gas having at least one of known andnegligible first light absorbance characteristics that overlap secondlight absorbance characteristics of the analyte compound within thewavelength range, and verifying a valid state of the analytical systemby determining that the first light intensity data do not deviate from astored data set that by greater than a pre-defined threshold deviation,the stored data set representing at least one previous measurementcollected during a previous instrument validation process performed onthe analytical system; and the sample analysis process comprising:receiving second light intensity data that quantify a second intensityof the light received at the detector while the light passes at leastonce through each of the reference gas in the validation cell and asample gas containing an unknown concentration of the analyte compound,and determining a concentration of the analyte compound in the samplegas by correcting the second light intensity data to account for a knownabsorbance of the light in the validation cell.
 2. An apparatus as inclaim 1, further comprising a sample measurement cell to contain ananalysis volume, the analysis volume containing the sample gas duringthe sample analysis process and the zero gas during the instrumentvalidation process, the sample measurement cell being positioned suchthat the light passes at least once through each of the analysis volumein the sample measurement cell and the reference gas in the validationcell during transmission of the light from the light source to thedetector.
 3. An apparatus as in claim 2, further comprising a flowswitching apparatus activated by the controller to admit the sample gasinto the analysis volume of the sample measurement cell during thesample analysis process and to admit the zero gas into the analysisvolume of the sample measurement cell during the instrument validationprocess.
 4. An apparatus as in claim 2, wherein the validation cellcomprises at least one of a light transmissive optical surface throughwhich the light passes, the light transmissive optical surface formingat least part of the validation cell, and a light reflective opticalsurface upon which the light impinges and is at least partiallyreflected, the light reflective optical surface forming at least part ofthe validation cell.
 5. (canceled)
 6. An apparatus as in claim 2,wherein the sample measurement cell comprises at least one of a lightreflective optical surface upon which the light impinges and is at leastpartially reflected, the light reflective optical surface forming atleast part of the sample measurement cell, and a light transmissiveoptical surface through which the light passes, the transmissive opticalsurface forming at least part of the sample measurement cell. 7.(canceled)
 8. An apparatus as in claim 2, further comprising: anintegrated optical cell that comprises the validation cell and thesample measurement cell.
 9. An apparatus as in claim 8, wherein theintegrated optical cell comprises a multipass cell comprising a firstreflective optical surface and a second optical reflective surface, eachreflecting the light at least once, and wherein the validation cell iscontained between at least part of the first reflective optical surfaceand a transmissive optical surface disposed between the first reflectiveoptical surface and the second optical reflective surface and a lighttransmissive surface disposed before the first reflective surface. 10.An apparatus as in claim 8, wherein the integrated optical cellcomprises a multipass cell comprising a first reflective optical surfaceand a second reflective optical surface, each reflecting the light atleast once, and wherein the validation cell is contained before at leastpart of the first reflective optical surface and a transmissive opticalsurface disposed before the first reflective surface.
 11. An apparatusas in claim 2, wherein at least one of the validation cell and thesample measurement cell is contained within a hollow core optical lightguide hermetically sealed on a first end by a first light-transmissiveoptical element allowing the light to enter the hollow optical lightguide and hermetically sealed on an opposite end by a second lighttransmissive optical element allowing the light to exit the hollow coreoptical light guide.
 12. An apparatus as in claim 2, wherein at leastone of the validation cell and the sample measurement cell is integralto a hermetically sealed laser package from which the light istransmitted via at least one transmissive optical element that fawns aseal to the hermetically sealed laser package.
 13. An apparatus as inclaim 1, further comprising at least one of a temperature sensor thatdetermines a temperature in the validation cell and a pressure sensorthat determines a pressure in the validation cell; and wherein theoperations performed by the controller further comprise: receiving atleast one of the temperature and the pressure; and adjusting the knownabsorbance of the light in the validation cell based on the one or moreof the temperature and the pressure as part of determining theconcentration of the analyte in the sample gas.
 14. An apparatus as inclaim 1, wherein the path of the light passes through a free gas spaceat least once in traversing between the light source and the detector;and wherein the flow switching apparatus admits the sample gas into thefree gas space during the sample analysis mode and admits the zero gasinto the free gas space during the validation mode.
 15. An apparatus asin claim 14, wherein the validation cell is integral to a firstreflector positioned on a first side of the free gas space and the pathof the light reflects at least once off of each of the first reflectorand a second reflector positioned on a opposite side of the free gasspace in traversing between the light source and the detector.
 16. Anapparatus as in claim 1, further comprising a temperature control systemthat maintains a temperature in the validation cell at a preset value.17. An apparatus as in claim 1, wherein the validation cell comprisesone of a sealed container pre-loaded with the reference gas and aflow-through cell through which the reference gas is passed.
 18. Amethod comprising: receiving first light intensity data that quantify afirst intensity of light received at a detector from a light sourceafter the light has passed at least once through each of a reference gasin a validation cell and a zero gas, the reference gas comprising aknown amount of an analyte compound, the light source emitting the lightin a wavelength range that comprises a spectral absorbance feature ofthe analyte compound, the zero gas having at least one of known andnegligible first light absorbance characteristics in the wavelengthrange; verifying a valid state of an analytical system comprising thelight source and the detector by determining that the first lightintensity data do not deviate from a stored data set by greater than apre-defined threshold deviation, the stored data set representing atleast one previous measurement collected during a previous instrumentvalidation process performed on the analytical system; receiving secondlight intensity data that quantify a second intensity of the lightreceived at the detector from the light source after the light passes atleast once through each of the reference gas in the validation cell anda sample gas containing an unknown concentration of the analytecompound; and determining a concentration of the analyte compound in thesample gas by correcting the second light intensity data to account fora known absorbance of the light in the validation cell.
 19. A method asin claim 18, further comprising: measuring one or more of a temperaturein the validation cell and a pressure in the validation cell; andadjusting the absorbance of the light in the validation cell based onthe one or more of the temperature and the pressure as part ofdetermining the concentration of the analyte in the sample gas.
 20. Amethod as in claim 18, wherein the zero gas comprises at least one of anoble gas, nitrogen gas, oxygen gas, air, hydrogen gas, a homonucleardiatomic gas, at least a partial vacuum, a hydrocarbon gas, afluorocarbon gas, a chlorocarbon gas, carbon monoxide gas, and carbondioxide gas.
 21. A method as in claim 18, further comprising: passingthe zero gas through at least one of a scrubber and a chemical converterto remove or reduce a concentration of the trace analyte therein beforedirecting the zero gas into the path of the light.
 22. Acomputer-readable medium comprising machine instructions that, whenexecuted by at least one programmable processor, cause the at least oneprogrammable processor to perform operations comprising: receiving firstlight intensity data that quantify a first intensity of light receivedat a detector from a light source after the light has passed at leastonce through each of a reference gas in a validation cell and a zerogas, the reference gas comprising a known amount of an analyte compound,the light source emitting light in a wavelength range that comprises aspectral absorbance feature of the analyte compound, the zero gas havingat least one of known and negligible first light absorbancecharacteristics in the wavelength range; verifying a valid state of ananalytical system comprising the light source and the detector bydetermining that the first light intensity data do not deviate from astored data set by greater than a pre-defined threshold deviation, thestored data set representing at least one previous measurement collectedduring a previous instrument validation process performed on theanalytical system; receiving second light intensity data that quantify asecond intensity of the light received at the detector from the lightsource after the light passes at least once through each of thereference gas in the validation cell and a sample gas containing anunknown concentration of the analyte compound; and determining aconcentration of the analyte compound in the sample gas by correctingthe second light intensity data to account for a known absorbance of thelight in the validation cell.